Effective Lifetime of Minority Carriers in Silicon: the Role of Heat- and Hydrogen Plasma Treatments
- 著者名:
Ulyashin, A. Simoen, E. Camel, L. De Wolf, S. Dekkers, H. Rafi, J.M. Beaucarne, G. Poortmans, J. Claeys, C. - 掲載資料名:
- High purity silicon VIII : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2004-05
- 発行年:
- 2004
- 開始ページ:
- 334
- 終了ページ:
- 345
- 総ページ数:
- 12
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774185 [1566774187]
- 言語:
- 英語
- 請求記号:
- E23400/200405
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Materials Research Society |
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society | |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
Electrochemical Society |
12
国際会議録
Application of UV Scanning Photoluminescence Spectroscopy for Minority Carrier Lifetime Mapping
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