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The Low-Frequency Noise in n-MOSFETs on Strained Silicon: Is There Room for Improvement?

著者名:
Simoen, E.
Eneman, G.
Verheyen, P.
Delhougne, R.
Rooyackers, R.
Loo, R.
Vandervorst, W.
De Meyer, K.
Claeys, C.
さらに 4 件
掲載資料名:
ULSI Process Integration : proceedings of the International Symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2005-06
発行年:
2005
開始ページ:
349
終了ページ:
359
総ページ数:
11
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774642 [1566774640]
言語:
英語
請求記号:
E23400/200506
資料種別:
国際会議録

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