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Novel Integration Concepts for SiGe-Based RF-MOSFETs (Invited paper)

著者名:
Ostling, M.
Malm, B. G.
Hellstrom, P-E.
Radamson, H.H.
Isheden, C.
Seger, J.
von Haartman, M.
Zhang, S.-L.
さらに 3 件
掲載資料名:
ULSI Process Integration : proceedings of the International Symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2005-06
発行年:
2005
開始ページ:
270
終了ページ:
284
総ページ数:
15
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774642 [1566774640]
言語:
英語
請求記号:
E23400/200506
資料種別:
国際会議録

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