59 Strain Effects on Transient Enhanced Diffusion and Deactivation of Arsenic Implanted in Silicon
- 著者名:
Dilliway, G. D. M. Smith, A. J. Hamilton, J. J. Xu, L. McNally, P. J. Cooke, G. Kheyrandish, H. Cowern, N. E. B. - 掲載資料名:
- Advanced gate stack, source/drain and channel engineering for Si-based CMOS, new materials, processes, and equipment : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2005-05
- 発行年:
- 2005
- 開始ページ:
- 497
- 終了ページ:
- 504
- 総ページ数:
- 8
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774635 [1566774632]
- 言語:
- 英語
- 請求記号:
- E23400/200505
- 資料種別:
- 国際会議録
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