A Thematic Approach to System Safety
- 著者名:
- Ekman, M. ( Sandia National Laboratories, Albuquerque, NM )
- Werner, P. ( Sandia National Laboratories, Albuquerque, NM )
- 掲載資料名:
- AIChE ANNUAL MEETING - MARCH 8-12, 1998 - NEW ORLEANS, LA
- シリーズ名:
- AIChE meeting [papers]
- シリーズ巻号:
- 1998
- 発行年:
- 1998
- ペーパー番号:
- 5e
- 総ページ数:
- 16
- 出版情報:
- New York: American Institute of Chemical Engineers
- 言語:
- 英語
- 請求記号:
- A08000
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
国際会議録
*Growth phenomena of quantum dot structures in the InGaAs system investigated by TEM techniques
MRS-Materials Research Society |
ESA Publications Division |
ESA Publications Division | |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers | |
Society of Plastics Engineers, Inc. (SPE) |
American Institute of Chemical Engineers |