Blank Cover Image

A Thematic Approach to System Safety

著者名:
  • Ekman, M. ( Sandia National Laboratories, Albuquerque, NM )
  • Werner, P. ( Sandia National Laboratories, Albuquerque, NM )
掲載資料名:
AIChE ANNUAL MEETING - MARCH 8-12, 1998 - NEW ORLEANS, LA
シリーズ名:
AIChE meeting [papers]
シリーズ巻号:
1998
発行年:
1998
ペーパー番号:
5e
総ページ数:
16
出版情報:
New York: American Institute of Chemical Engineers
言語:
英語
請求記号:
A08000
資料種別:
国際会議録

類似資料:

Akladios,M., McMullin,D., Gopalakrishnan,B., Bell,C., Carr,M., Kapoor,A., Lobo,P., Myers,W.R., Becker,P.E.

SPIE - The International Society for Optical Engineering

Ivanenko, M., Werner, M., Klasing, M., Hering, P.

SPIE - The International Society of Optical Engineering

Wetherholt, M.J., Penix, J.J.

ESA Publications Division

Tatsuo, M., Satob., N., Satob, T., Hisatome, Y., Doi, S., Kuwao, F.

ESA Publications Division

Y. Zuo, F. Kiamilev, X. Wang, P. Gui, J. Ekman, M. McFadden, M. Haney

SPIE

Carlotto,M.J.

SPIE-The International Society for Optical Engineering

Ansorge,W.

SPIE-The International Society for Optical Engineering

E. Zilioli, P.A. Brivio, M. Arrigazzi, G.M. Lechi

Society of Photo-optical Instrumentation Engineers

Werner, Sally A., Berenter, Joel R.

Society of Plastics Engineers, Inc. (SPE)

Dowell, A. M. Ⅲ, P.E.

American Institute of Chemical Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12