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A New Method of Diagnosing Simultaneous Multiple Faults via Neural Networks

著者名:
  • Lee, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
  • Park, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
  • Himmelblau, D. ( University of Texas at Austin, Austin, TX )
掲載資料名:
AIChE ANNUAL MEETING - NOVEMBER 16-21, 1997 - LOS ANGELES, CA
シリーズ名:
AIChE meeting [papers]
シリーズ巻号:
1997
発行年:
1997
ペーパー番号:
215b
総ページ数:
26
出版情報:
New York: American Institute of Chemical Engineers
言語:
英語
請求記号:
A08000
資料種別:
国際会議録

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