Blank Cover Image

Risk Based Inspection from New Technology to RAGAGEP

著者名:
  • Aller, J. ( Capstone Engineering Services, Inc., Houston, TX )
  • Munsterman, T. ( Capstone Engineering Services, Inc., Houston, TX )
  • Reynolds, J. ( Shell Oil Products, Houston, TX )
掲載資料名:
AIChE NATIONAL MEETING - MARCH 9-13, 1997 - HOUSTON, TX
シリーズ名:
AIChE meeting [papers]
シリーズ巻号:
1997
発行年:
1997
ペーパー番号:
16e
総ページ数:
9
出版情報:
New York: American Institute of Chemical Engineers
言語:
英語
請求記号:
A08000
資料種別:
国際会議録

類似資料:

Shah,N.J., Dwivedy,K.K.

SPIE-The International Society for Optical Engineering

Conley, Michael. J., Stevens, Ken.

American Institute of Chemical Engineers

Balkey, K. R., Ayyub, B. M., Chapman, O. J. V.

The American Society of Mechanical Engineers

Marvin J. Cohn, Jeffrey T. Fong, Philip M. Besuner

American Society of Mechanical Engineers

Febo, Henry L.

American Institute of Chemical Engineers

Kusova, J., Dobias, L., Adamcik, M., Havrankova, J., Mikulenkova, I., Adamus, T., Burdova, J., Kubackova, J., Tomaskova, …

IOS Press

John Camburn, Kenneth L. Saunders

American Society of Mechanical Engineers

VANEERDEN Menobart, MUNSTERMAN J. M.

Springer-Verlag

Andrews, C.J.

Kluwer Academic Publishers

Marvin J. Cohn

American Society of Mechanical Engineers

Broadbent, W.H., Wiley, J.N., Saidin, Z.K., Watson, S.G., Alles, D.S., Zurbrick, L.S., Mack, C.A.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12