Application of Expert Systems to Environmental Problems

Application of Expert Systems to Environmental Problems

著者名:

Hushon, Judith M. ( Roy F. Weston, Inc. 955 L'Enfant Plaza, SW Washington. DC 20024 )
Pandit, Nitin S. ( Roy F. Weston, Inc. 955 L'Enfant Plaza, SW Washington. DC 20024 )

掲載資料名:

AIChE ANNUAL MEETING, NEW YORK, NY - NOVEMBER 15-20, 1987

シリーズ名:

AIChE meeting [papers]

シリーズ巻号:

1987

発行年:

1987

ペーパー番号:

118f

総ページ数:

14

出版情報:

New York: American Institute of Chemical Engineers

言語:

英語

請求記号:

A08000

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015140
シリーズID:	PA00000179
会議名:	AIChE Annual Meeting
回次:	1987
会議開催地:	New York City, NY, USA
会議開催年:	1987.11.15-1987.11.20
論文注記:	Fiche 96

類似資料:

1 国際会議録 Overview of Environmental Expert Systems Hushon, Judith M. American Chemical Society	7 国際会議録 Expert system applications in underwater acoustics Maksym N. J., Hayashi M. R. Kluwer Academic Publishers
2 国際会議録 The Defense Priority Model for Department of Defense Remedial Site Ranking Hushon, Judith M. American Chemical Society	8 国際会議録 EXPERIMENTAL APPLICATIONS OF AN EXPERT SYSTEM TO OPERATOR PROBLEM SOLVING IN PROCESS CONTROL Nelson, William R., Jenkins, James P. PhD American Institute of Chemical Engineers
3 国際会議録 An Intelligent Quality Assurance Planner for Environmental Data: Functional Requirements Pandit, Nitin, Mateo, John, Coakley, William American Chemical Society	9 国際会議録 Verification and Validation of Environmental Expert Systems Stunder, Mark American Chemical Society
4 国際会議録 Application of an Expert System to Assist in Preparation for Safety, Health, and Environmental Reviews Dowell, A. M. Ⅲ, P.E. American Institute of Chemical Engineers	10 国際会議録 APPLICATION Of KNOWLEDGE-BASED SYSTEMS FOR THE DIAGNOSIS OF OPERATING PROBLEMS Davia, J. F., Punch, M. F., III, Shum, S. K., Chandrasekaran, B. American Institute of Chemical Engineers
5 国際会議録 Current problems and future developments in mineral and energy resource expert system development Koch S. G., Campbell N. A., Fabbri G. A., Lanyon W., Pereira G. H., Shulman J. M., Sinding-Larsen S. K., Stokke R. P., … D. Reidel	11 国際会議録 Expert system technology in observing tools Wolf,K.R., Burkhardt,C., Fishman,M., Grosvenor,S., Jones,J.E., Koratkar,A., Ruley,L. SPIE - The International Society for Optical Engineering
6 国際会議録 Improved Resonant Inspection Using Data Dependent Systems Mattson, S.G., Pandit, S.M. SPIE-The International Society for Optical Engineering	12 国際会議録 Optical wear assessment system for grinding tools Heger, T., Pandit, M.C. SPIE-The International Society for Optical Engineering

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