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Grating gated FETs as narrowband tunable terahertz detectors

著者名:
Shaner, E. A. ( Sandia National Labs. (USA) )
Wanke, M. C. ( Sandia National Labs. (USA) )
Lee, M. ( Sandia National Labs. (USA) )
Reno, J. L. ( Sandia National Labs. (USA) )
Allen, S. J. ( Univ. of California/Santa Barbara (USA) )
Peralta, X. G. ( Univ. of California/Santa Barbara (USA) )
さらに 1 件
掲載資料名:
Terahertz for military and security applications III : 28-29 March 2005, Orlando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5790
発行年:
2005
開始ページ:
116
終了ページ:
122
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457752 [0819457752]
言語:
英語
請求記号:
P63600/5790
資料種別:
国際会議録

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