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Temperature dependent analysis of resistance fluctuations in Taguchi gas sensors

著者名:
  • Ma, S. ( Northwest Normal Univ. (China) )
  • Ma, Z. ( Northwest Normal Univ. (China) )
  • Li, Y. ( Northwest Normal Univ. (China) and Texas A&M Univ. (USA) )
掲載資料名:
Noise and Information in Nanoelectronics, Sensors, and Standards III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5846
発行年:
2005
開始ページ:
204
終了ページ:
209
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458414 [0819458414]
言語:
英語
請求記号:
P63600/5846
資料種別:
国際会議録

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