Low frequency noise of light emitting diodes (Invited Paper)
- 著者名:
Rumyantsev, S. L. ( Rensselaer Polytechnic Institute (USA) and The loffe Institute of Russian Academy of Sciences (Russia) ) Sawyer, S. ( Rensselaer Polytechnic Institute (USA) ) Pala, N. ( Rensselaer Polytechnic Institute (USA) and Sensor Electronic Technology, Inc. (USA) ) Shur, M. S. ( Rensselaer Polytechnic Institute (USA) ) Bilenko, Yu. ( Sensor Electronic Technology, Inc. (USA) ) Zhang, J. P. ( Sensor Electronic Technology, Inc. (USA) ) Hu, X. ( Sensor Electronic Technology, Inc. (USA) ) Lunev, A. ( Sensor Electronic Technology, Inc. (USA) ) Deng, J. ( Sensor Electronic Technology, Inc. (USA) ) Gaska, R. ( Sensor Electronic Technology, Inc. (USA) ) - 掲載資料名:
- Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5844
- 発行年:
- 2005
- 開始ページ:
- 75
- 終了ページ:
- 85
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Washington: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458391 [0819458392]
- 言語:
- 英語
- 請求記号:
- P63600/5844
- 資料種別:
- 国際会議録
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9
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Optimization of a UV light-emitting diode based fluorescence-phase sensor (Invited Paper) [6398-33]
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