In-line color variation analysis to quantify the quality of electroplated deposits in high volume manufacture

In-line color variation analysis to quantify the quality of electroplated deposits in high volume manufacture

著者名:

Byrne, G. ( Molex Ireland Ltd. (Ireland) )
Sheahan, C. ( Univ. of Limerick (Ireland) )

掲載資料名:

Opto-Ireland 2005: Imaging and Vision

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5823

発行年:

2005

開始ページ:

113

終了ページ:

120

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458087 [0819458082]

言語:

英語

請求記号:

P63600/5823

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015055
シリーズID:	PA00000029
会議名:	Opto-Ireland
回次:	2005
会議開催地:	Dublin, Ireland
会議開催年:	2005.04.05-2005.04.06

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