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Analysis of wideband EMI field data

著者名:
Whitecotton, B. ( GE Infrastructure Security (USA) )
McManus, T. ( GE Infrastructure Security (USA) )
Kuhn, S. ( GE Infrastructure Security (USA) )
Dalichaouch, Y. ( GE Infrastructure Security (USA) )
Carin, L. ( Duke Univ. (USA) )
Torrione, P. ( Duke Univ. (USA) )
Collins, L. ( Duke Univ. (USA) )
さらに 2 件
掲載資料名:
Detection and remediation technologies for mines and minelike targets X : 28 March-1 April, 2005, Orlando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5794
発行年:
2005
開始ページ:
254
終了ページ:
262
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457790 [0819457795]
言語:
英語
請求記号:
P63600/5794-1
資料種別:
国際会議録

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