Weibull statistical analysis of sapphire strength improvement through chemomechanical polishing

Weibull statistical analysis of sapphire strength improvement through chemomechanical polishing

著者名:

Klein, C. A. ( c. a. k. analytics, international (USA) )
Schmid, F. ( Crystal Systems, Inc. (USA) )

掲載資料名:

Window and dome technologies and materials IX : 28-29 March 2005, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5786

発行年:

2005

開始ページ:

175

終了ページ:

187

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457714 [081945771X]

言語:

英語

請求記号:

P63600/5786

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015017
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Window and Dome Technologies and Materials
回次:	2005 : 9th
会議開催地:	Orlando, FL, USA
会議開催年:	2005.03.28-2005.03.29

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