Characterization of crack propagation during sonic IR inspection

Characterization of crack propagation during sonic IR inspection

著者名:

Kephart, J. ( Rowan Univ. (USA) )
Chen, J. ( Rowan Univ. (USA) )
Zhang, H. ( Rowan Univ. (USA) )

掲載資料名:

Thermosense XXVII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5782

発行年:

2005

開始ページ:

234

終了ページ:

244

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457677 [0819457671]

言語:

英語

請求記号:

P63600/5782

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015012
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Thermosense
回次:	2005 : 27th
会議開催地:	Orlando, FL, USA
会議開催年:	2005.03.29-2005.03.31

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