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Algorithm for high-accuracy particle image position estimation in PIV applications

著者名:
掲載資料名:
Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5776
発行年:
2005
開始ページ:
163
終了ページ:
167
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457578 [0819457574]
言語:
英語
請求記号:
P63600/5776
資料種別:
国際会議録

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