Recent developments in spectral interference microscopes (Invited Paper)

Recent developments in spectral interference microscopes (Invited Paper)

著者名:

Takeda, M. ( Univ. of Electro-Communications (Japan) )
Mehta, D. S. ( Indian Institute of Technology/Delhi (India) )
Pawlowski, M. E. ( Univ. of Electro-Communications (Japan) )
Kurokawa, T. ( Tokyo Univ. of Agriculture and Technology (Japan) )

掲載資料名:

Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5776

発行年:

2005

開始ページ:

22

終了ページ:

28

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457578 [0819457574]

言語:

英語

請求記号:

P63600/5776

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015004
シリーズID:	PA00000029
会議名:	International Symposium on Laser Metrology Macro-, micro-, and nano-technologies applied in science, engfneering, and industry
回次:	2005 : 8th
会議開催地:	Merida, Yucatan, Mexico
会議開催年:	2005.02.14-2005.02.18

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