The effects of ion cleaning on the roughness of substrates and laser-induced damage thresholds of films
- 著者名:
Zhang, D. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) Shao, J. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) Fan, S. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) Zhao, Y. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) Fan, R. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) Wang, Y. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) Fan, Z. ( Shanghai Institute of Optics and Fine Mechanics. CAS (China) ) - 掲載資料名:
- Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5774
- 発行年:
- 2004
- 開始ページ:
- 345
- 終了ページ:
- 348
- 総ページ数:
- 4
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457554 [0819457558]
- 言語:
- 英語
- 請求記号:
- P63600/5774
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
国際会議録
Single-shot and multishot laser-induced damage of HfO2/SiO2 multilayer at YAG third harmonic
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |