Thickness effect of LaNiO3 buffer layer on microstructure and electrical properties of PZT thin films

Thickness effect of LaNiO3 buffer layer on microstructure and electrical properties of PZT thin films

著者名:

Du, W. ( Shanghai Univ. (China) )
Lu, W. ( Shanghai Univ. (China) )
Cheng, J. ( Shanghai Univ. (China) )
Meng, Z. ( Shanghai Univ. (China) )

掲載資料名:

Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5774

発行年:

2004

開始ページ:

241

終了ページ:

245

総ページ数:

5

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457554 [0819457558]

言語:

英語

請求記号:

P63600/5774

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015002
シリーズID:	PA00000029
会議名:	International Conference on Thin Film Physics and Applications
回次:	2004 : 5th
会議開催地:	Shanghai, China
会議開催年:	2004.05.31-2004.06.02

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