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The study on the interface adhesion comparison of MgF2. Al2O3. SiO2, and Ag thin films

著者名:
  • Xu, X. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
  • Tang, Z. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
  • Shao, J. D. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
  • Fan, Z. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
掲載資料名:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5774
発行年:
2004
開始ページ:
156
終了ページ:
159
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457554 [0819457558]
言語:
英語
請求記号:
P63600/5774
資料種別:
国際会議録

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