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X-ray microscopy for NDE of micro- and nano-structrues(Invited Paper)

著者名:
掲載資料名:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5766
発行年:
2005
開始ページ:
40
終了ページ:
48
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457479 [0819457477]
言語:
英語
請求記号:
P63600/5766
資料種別:
国際会議録

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