X-ray microscopy for NDE of micro- and nano-structrues(Invited Paper)
- 著者名:
- Wang, S. ( Xradia, Inc. (USA) )
- Duewer, F. ( Xradia, Inc. (USA) )
- Feser, M. ( Xradia, Inc. (USA) )
- Scott, D. ( Xradia, Inc. (USA) )
- Yun, W. ( Xradia, Inc. (USA) )
- 掲載資料名:
- Testing, Reliability, and Application of Micro- and Nano-Material Systems III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5766
- 発行年:
- 2005
- 開始ページ:
- 40
- 終了ページ:
- 48
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457479 [0819457477]
- 言語:
- 英語
- 請求記号:
- P63600/5766
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |