Flexibility-based damage identification algorithm embedded in sensor network emvironment

Flexibility-based damage identification algorithm embedded in sensor network emvironment

著者名:

Masuda, A. ( Kyoto Institute of Technology(Japan) )
Sone, A. ( Kyoto Institute of Technology(Japan) )
Yamashita, M. ( Kyoto Institute of Technology(Japan) )
Hashimoto, Y. ( Kyoto Institute of Technology(Japan) )

掲載資料名:

Smart structures and materials 2005 : Sensors and smart structures technologies for civil, mechanical, and aerospace systems : 7-10 March 2005, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5765

発行年:

2005

開始ページ:

217

終了ページ:

225

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457462 [0819457469]

言語:

英語

請求記号:

P63600/5765-1

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014992
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2005
会議開催地:	San Diego, CA, USA
会議開催年:	2005.03.07-2005.03.10

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