Development of specifications for an integrated piezoelectric wafer active sensors system

Development of specifications for an integrated piezoelectric wafer active sensors system

著者名:

Jenkins, C. ( Univ. of South Carolina(USA) )
Giurgiutiu, V. ( Univ. of South Carolina(USA) )
Lin, B. ( Univ. of South Carolina(USA) )
Liu, W. ( Univ. of South Carolina(USA) )

掲載資料名:

Smart structures and materials 2005 : Smart structures and integrated system : 7-10 March 2005, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5764

発行年:

2005

開始ページ:

509

終了ページ:

521

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457455 [0819457450]

言語:

英語

請求記号:

P63600/5764

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014991
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2005
会議開催地:	San Diego, CA, USA
会議開催年:	2005.03.07-2005.03.10

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2 国際会議録 On the modeling of piezoelectric wafer active sensor impedance analysis for structural health monitoring [6174-08] Lin, B., Giurgiutiu, V. SPIE - The International Society of Optical Engineering	8 テクニカルペーパー New Results in the Use of Piezoelectric Wafer Active Sensors for Structural Health Monitoring Giurgiutiu, V. American Institute of Aeronautics and Astronautics
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