Investigating a lithography strategy for diagonal routing architecture at sub-100nm technology nodes
- 著者名:
Li, S. ( Cadence Design Systems, Inc. (USA) ) Chen, T. ( ASML MaskTools, Inc. (USA) ) Shah, S. ( Cadence Design Systems, Inc. (USA) ) Joshi, K. ( Cadence Design Systems, Inc. (USA) ) Thumaty, K. ( Cadence Design Systems, Inc. (USA) ) Arora, N. ( Cadence Design Systems, Inc. (USA) ) - 掲載資料名:
- Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5756
- 発行年:
- 2005
- 開始ページ:
- 368
- 終了ページ:
- 377
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457363 [0819457361]
- 言語:
- 英語
- 請求記号:
- P63600/5756
- 資料種別:
- 国際会議録
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