Flash memory-cell characterization using two-transistor cell compact macro-model for system-on-chip design

Flash memory-cell characterization using two-transistor cell compact macro-model for system-on-chip design

著者名:

Chen, C. ( Silicon Storage Technology, Inc. (USA) )
Saha, S. ( Silicon Storage Technology, Inc. (USA) )

掲載資料名:

Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5755

発行年:

2005

開始ページ:

79

終了ページ:

86

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457356 [0819457353]

言語:

英語

請求記号:

P63600/5755

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014982
シリーズID:	PA00000029
会議名:	SPIE Advanced Lithography : Optical Microlithography
回次:	2005 : 2nd
会議開催地:	San Jose, CA, USA
会議開催年:	2005.03.03-2005.03.04

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