Blank Cover Image

Double side hologram reconstruction for digital holographic data storage using phase conjugated reference beam

著者名:
Kim, J. ( Chungbuk National Univ. (South Korea) )
Kwon, K. ( Chungbuk National Univ. (South Korea) )
Kim, N. ( Chungbuk National Univ. (South Korea) )
Jeon, S. ( Univ. of Incheon (South Korea) )
Jung, J. ( Suwon Science College (South Korea) )
Kim, E. ( Yonsei Univ. (South Korea) )
さらに 1 件
掲載資料名:
Practical Holography XIX: Materials and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5742
発行年:
2005
開始ページ:
314
終了ページ:
320
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457165 [0819457167]
言語:
英語
請求記号:
P63600/5742
資料種別:
国際会議録

類似資料:

Kim, J., Kwon, K., Kim, N., Jeon, S., Jung, J.

SPIE - The International Society of Optical Engineering

Do., D. D., Kim, N., Gil, S. K., Jeon, S. H., Lee, K. Y.

SPIE - The International Society of Optical Engineering

N. Kim, K. Jung, K. Kim, P. Yoon, J. Park

SPIE - The International Society of Optical Engineering

Booij,S.M., Absil,L.H.J., Bruinsma,A.J.A., Braat,J.J.M., Brug,H.H.van

SPIE - The International Society for Optical Engineering

Kim, J.-H., Kim, N.

SPIE-The International Society for Optical Engineering

Denz,C., Muller,K.-O., Visinka,F., Tschudi,T.T.

SPIE - The International Society for Optical Engineering

S. K. Gil, S. H. Jeon, J. R. Jeong

Society of Photo-optical Instrumentation Engineers

Gil, S. K., Jeon, S. H., Kim, N., Jeong, J. R.

SPIE - The International Society of Optical Engineering

Burr,G.W., Coufal,H.J., Hoffnagle,J.A., Jefferson,C.M., Jurich,M.C., Macfarlane,R.M., Shelby,R.M.

SPIE-The International Society for Optical Engineering

Kim, J.H., Choi, J.K., An, J.W., Kim, N., Lee, K.Y., Jeon, S.H.

SPIE-The International Society for Optical Engineering

T. V. Vu, S.-W. Lee, N. Kim, S.-K. Gil, E.-K. Kim

Society of Photo-optical Instrumentation Engineers

Muller,K.-O., Denz,C., Rauch,T., Heimann,T., Trumpfheller,J., Tschudi,T.T.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12