Advanced process and device modeling of full-frame CCD imagers (Invited Paper)
- 著者名:
- Wordelman, C.J. ( Synopsys Corp. (USA) )
- Banghart, E.K. ( Eastman Kodak Co. (USA) )
- 掲載資料名:
- Physics and Simulation of Optoelectronic Devices XIII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5722
- 発行年:
- 2005
- 開始ページ:
- 501
- 終了ページ:
- 515
- 総ページ数:
- 15
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456960 [0819456969]
- 言語:
- 英語
- 請求記号:
- P63600/5722
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |