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High-resolution microelectromechanical scanners for miniaturized dual-axes confocal microscopes (Invited Paper)

著者名:
Ra, H. ( Stanford Univ. (USA) )
Jung, I.-W. ( Stanford Univ. (USA) )
Lee, D. ( Stanford Univ. (USA) )
Krishnamoorthy, U. ( Stanford Univ. (USA) )
Yu, K. ( Stanford Univ. (USA) )
Solgaard, O. ( Stanford Univ. (USA) )
さらに 1 件
掲載資料名:
MOEMS Display and Imaging Systems III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5721
発行年:
2005
開始ページ:
132
終了ページ:
135
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819456953 [0819456950]
言語:
英語
請求記号:
P63600/5721
資料種別:
国際会議録

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