High-speed slit-scanning confocal laser microscopy with an acousto-optic beam deflector and a line scan camera

High-speed slit-scanning confocal laser microscopy with an acousto-optic beam deflector and a line scan camera

著者名:

Han, S. ( Yonsei Univ. (South Korea) )
Im, K.-B. ( Yonsei Univ. (South Korea) )
Park, H. ( Yonsei Univ. (South Korea) )
Kim, D. ( Coreware (South Korea) )
Kim, B.-M. ( Yonsei Univ. (South Korea) )

掲載資料名:

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5701

発行年:

2005

開始ページ:

164

終了ページ:

171

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819456755 [0819456756]

言語:

英語

請求記号:

P63600/5701

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014918
シリーズID:	PA00000029
会議名:	SPIE BiOS : Three-dimensional and multidimensional microscopy
回次:	2005 : 12th
会議開催地:	San Jose, CA, USA
会議開催年:	2005.01.25-2005.01.27

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