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Cell damage during femtosecond optical trapping

著者名:
Im, K.-B. ( Yonsei Univ. (South Korea) )
Han, S. ( Yonsei Univ. (South Korea) )
Park, H. ( Yonsei Univ. (South Korea) )
Jin, D. ( Yonsei Univ. (South Korea) )
Kim, S.-K. ( Yonsei Univ. (South Korea) )
Kim, B.-M. ( Yonsei Univ. (South Korea) )
さらに 1 件
掲載資料名:
Imaging, Manipulation, and Analysis of Biomolecules and Cells: Fundamentals and Applications III
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5699
発行年:
2005
開始ページ:
274
終了ページ:
280
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819456731 [081945673X]
言語:
英語
請求記号:
P63600/5699
資料種別:
国際会議録

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