Determining digital image origin using sensor imperfections

Determining digital image origin using sensor imperfections

著者名:

Lukas, J. ( SUNY/Binghamton (USA) )
Fridrich, J. ( SUNY/Binghamton (USA) )
Goljan, M. ( SUNY/Binghamton (USA) )

掲載資料名:

Image and Video Communications and Processing 2005

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5685

発行年:

2005

開始ページ:

249

終了ページ:

260

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456588 [0819456586]

言語:

英語

請求記号:

P63600/5685-1

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014901
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Image and Video Communications and Processing
回次:	2005
会議開催地:	San Jose, CA, USA
会議開催年:	2005.01.18-2005.01.20

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