Detection of mass tumors in mammograms using SVD subspace analysis
- 著者名:
- Lin, E. T. ( Purdue Univ. (USA) )
- Liu, Y. ( Nokia Inc. (USA) )
- Delp, E. J. ( Purdue Univ. (USA) )
- 掲載資料名:
- Computational imaging III : 17-18 January 2005, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5674
- 発行年:
- 2005
- 開始ページ:
- 187
- 終了ページ:
- 198
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456472 [0819456470]
- 言語:
- 英語
- 請求記号:
- P63600/5674
- 資料種別:
- 国際会議録
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SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
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