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Removal of spatially correlated noise by independent component analysis

著者名:
  • Zeng, X. ( California State Univ. /Northridge (USA) )
  • Chen, X. ( Ritsumeikan Univ. (Japan) )
  • Nakao, Z. ( Univ. of the Ryukyus (Japan) )
  • Alphen, D. van ( California State Univ. /Northridge (USA) )
掲載資料名:
Applications of neural networks and machine learning in image processing IX : 19-20 January 2005, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5673
発行年:
2005
開始ページ:
99
終了ページ:
105
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819456465 [0819456462]
言語:
英語
請求記号:
P63600/5673
資料種別:
国際会議録

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