Volume-change thermal-lithography technique for ultra-high density optical ROM mastering process(Invited Paper)
- 著者名:
- Kuwahara, M. ( National Institute of Advanced Industrial Science and Technology(Japan) )
- Kim, J. ( Samsung Electronics Co. , Ltd. (South Korea) )
- Yoon, D. ( Samsung Electronics Co. , Ltd. (South Korea) )
- Tominaga, J. ( National Institute of Advanced Industrial Science and Technology(Japan) )
- 掲載資料名:
- Fifth International Symposium on Laser Precision Microfabrication : 11-14 May, 2004, Nara, Japan
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5662
- 発行年:
- 2004
- 開始ページ:
- 51
- 終了ページ:
- 56
- 総ページ数:
- 6
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456236 [0819456233]
- 言語:
- 英語
- 請求記号:
- P63600/5662
- 資料種別:
- 国際会議録
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High-density interleaved VCSEL-RCPD arrays for optical information processing(Invited Paper)
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Performance of immersion lithography for 45-nm-node CMOS and ultra-high density SRAM with 0.25um2
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