Highly accurate FTIR observations from the scanning HIS aircraft instrument
- 著者名:
Revercomb, H. E. ( Univ. of Wisconsin/Madison (USA) ) Tobin, D. C. ( Univ. of Wisconsin/Madison (USA) ) Knuteson, R. O. ( Univ. of Wisconsin/Madison (USA) ) Best, F. A. ( Univ. of Wisconsin/Madison (USA) ) Smith, W. L. ( Sr., Hampton Univ. (USA) ) van Delst, P. F. W. ( Univ. of Wisconsin/Madison (USA) ) LaPorte, D. D. ( Univ. of Wisconsin/Madison (USA) ) Ellington, S. D. ( Univ. of Wisconsin/Madison (USA) ) Werner, M. W. ( Univ. of Wisconsin/Madison (USA) ) Dedecker, R. G. ( Univ. of Wisconsin/Madison (USA) ) Garcia, R. K. ( Univ. of Wisconsin/Madison (USA) ) Ciganovich, N. N. ( Univ. of Wisconsin/Madison (USA) ) Howell, H. B. ( Univ. of Wisconsin/Madison (USA) ) Olson, E. R. ( Univ. of Wisconsin/Madison (USA) ) Dutcher, S. B. ( Univ. of Wisconsin/Madison (USA) ) Taylor, J. K. ( Univ. of Wisconsin/Madison (USA) ) - 掲載資料名:
- Multispectral and hyperspectral remote sensing instruments and applications II : 9-11 November 2004, Honolulu, Hawaii, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5655
- 発行年:
- 2004
- 開始ページ:
- 41
- 終了ページ:
- 53
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456168 [0819456160]
- 言語:
- 英語
- 請求記号:
- P63600/5655
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |