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Test method for evaluating optical disk reliability (Invited Paper)

著者名:
  • Irie, M. ( Osaka Sangyo Univ. (Japan) )
  • Okino, Y. ( Kansai Univ. (Japan) )
  • Kubo, T. ( T. Kubo Engineering Science Office (Japan) )
掲載資料名:
Advances in optical data storage technology : 8-10 November, 2004, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5643
発行年:
2004
開始ページ:
205
終了ページ:
210
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455987 [0819455989]
言語:
英語
請求記号:
P63600/5643
資料種別:
国際会議録

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