Blank Cover Image

The Influence of electron trap on photoelectron decay behavior in silver halide

著者名:
掲載資料名:
Advances in optical data storage technology : 8-10 November, 2004, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5643
発行年:
2004
開始ページ:
94
終了ページ:
100
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455987 [0819455989]
言語:
英語
請求記号:
P63600/5643
資料種別:
国際会議録

類似資料:

1 国際会議録 Computer simulation of photpelectron decay process of silver halide microcrystals

Geng, A.C., Li, X.W., Fu, G.S., Yang, S.P., Lu, X.D.

SPIE-The International Society for Optical Engineering
7 国際会議録 Application of YAG laser in photoelectron action measurement

Dong, G.Y., Li, X.W., Yang, S.P., Fu, G.S., Liu, Q.B.

SPIE-The International Society for Optical Engineering
2 国際会議録 Measurement of optoelectron lifetime in imaging process of silver halide material

Fu, G., Yang, S., Li, X., Hu, X.

SPIE-The International Society for Optical Engineering
8 国際会議録 Investigation of photoelectron properties in cubic AgCI emulsion with uniformly doped formate ions [6149-68]

Fu, G.S., Zhou,X., Yang,S.P., Li, X. W., Tian,X.D., Han, L.

SPIE - The International Society of Optical Engineering
3 国際会議録 Measurement of photoelectrons decay in doping AgCl by microwave absorption phase-sensitive technique

X. Dai, G. Dong, H. Liu, X. Li, S. Yang

Society of Photo-optical Instrumentation Engineers
9 国際会議録 Shallow electron centres in CdF2:M3+ and silver halides

Fu,C.-R., Song,K.S.

Trans Tech Publications
4 国際会議録 Photoelectronic properties in silver halide microcrystals

Yang, S., Lu, X., Dong, G., Li, X.-W., Han, L.

SPIE - The International Society of Optical Engineering
10 国際会議録 Influence of Phosphorus and Boron on Creep Behavior and Fracture Mechanism of GH4169 Superalloy

S.G. Tian, X. Wang, C. Liu, W.R. Sun

Trans Tech Publications
5 国際会議録 Properties of shallow electron trap dopants in AgCl optical storage materials

Geng, A., Li, X.-W., Yang, S., Dong, G., Fu, G.

SPIE-The International Society for Optical Engineering
11 国際会議録 Dynamics analysis of photoelectron decay in cubic AgCl microcrystals by sulfur sensitization

X. Li, Y. Hu, R. Zhang, J. Zhang, G. Dong

Society of Photo-optical Instrumentation Engineers
6 国際会議録 Behaviors of free electrons and shallow-trapped eletrons in sulfer-sensitized silvur halide material

Lu, X.D., Han, L., Yang, S.P., Li, X.W., Geng, A.C.

SPIE-The International Society for Optical Engineering
12 国際会議録 Measurement of photoelectron behavior in K4Ru(CN)6-doped AgCl emulsion

Dai, X., Jiang, X., Li, X., Dong, G., Yang, S., Zhou, X.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12