A new high-precision measurement system used in the image calibration of a large-sized photographic instrument
- 著者名:
- 掲載資料名:
- Optical design and testing II : 8-12 November 2004, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5638
- 発行年:
- 2004
- 開始ページ:
- 404
- 終了ページ:
- 411
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455932 [0819455938]
- 言語:
- 英語
- 請求記号:
- P63600/5638-1
- 資料種別:
- 国際会議録
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