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A novel aspheric surface testing method using part-compensating lens

著者名:
  • Liu, H. ( Beihang Univ. (China) )
  • Hao, Q. ( Beijing Institute of Technology (China) )
  • Zhu, Q. ( Beijing Institute of Technology (China) )
  • Sha, D. ( Beijing Institute of Technology (China) )
  • Zhang, C. ( Beihang Univ. (China) )
掲載資料名:
Optical design and testing II : 8-12 November 2004, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5638
発行年:
2004
開始ページ:
324
終了ページ:
329
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455932 [0819455938]
言語:
英語
請求記号:
P63600/5638-1
資料種別:
国際会議録

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