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A new method of ICCD imaging system MRC measurement

著者名:
  • Li, S. ( Beijing Institute of Technology (China) and Beijing Special Vehicle Institute (China) )
  • Jin, W. ( Beijing Institute of Technology (China) )
  • Wang, X. ( Beijing Institute of Technology (China) )
  • Zhang, W. ( Beijing Institute of Technology (China) )
  • Dong, H. ( Beijing Institute of Technology (China) )
掲載資料名:
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5637
発行年:
2004
開始ページ:
703
終了ページ:
707
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455925 [081945592X]
言語:
英語
請求記号:
P63600/5637
資料種別:
国際会議録

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