A new method of ICCD imaging system MRC measurement
- 著者名:
- Li, S. ( Beijing Institute of Technology (China) and Beijing Special Vehicle Institute (China) )
- Jin, W. ( Beijing Institute of Technology (China) )
- Wang, X. ( Beijing Institute of Technology (China) )
- Zhang, W. ( Beijing Institute of Technology (China) )
- Dong, H. ( Beijing Institute of Technology (China) )
- 掲載資料名:
- Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5637
- 発行年:
- 2004
- 開始ページ:
- 703
- 終了ページ:
- 707
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455925 [081945592X]
- 言語:
- 英語
- 請求記号:
- P63600/5637
- 資料種別:
- 国際会議録
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12
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