Near-field Raman spectral measurement of monocrystalline silicon by apertureless SNOM in reflection geometry
- 著者名:
- 掲載資料名:
- Nanophotonics, Nanostructure, and Nanometrology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5635
- 発行年:
- 2004
- 開始ページ:
- 292
- 終了ページ:
- 296
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455901 [0819455903]
- 言語:
- 英語
- 請求記号:
- P63600/5635
- 資料種別:
- 国際会議録
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Near-field intensity distribution from a bow-tie aperture VCSEL with its polarization stateimproved
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Numerical simulation of electromagnetic propagation in super-resolution near-field structure
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SPIE-The International Society for Optical Engineering |
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SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |