Blank Cover Image

The numerical simulation of field enhancement in near-field scanning Raman microscopy

著者名:
  • Li, Y. ( Dalian Univ. of Technology (China) )
  • Wu, S. ( Dalian Univ. of Technology (China) )
  • Jian, G. ( Dalian Univ. of Technology (China) )
  • Liu, K. ( Dalian Univ. of Technology (China) )
掲載資料名:
Nanophotonics, Nanostructure, and Nanometrology
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5635
発行年:
2004
開始ページ:
31
終了ページ:
37
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455901 [0819455903]
言語:
英語
請求記号:
P63600/5635
資料種別:
国際会議録

類似資料:

1 国際会議録 Near-field scanning optical microscopy imaging:theory,simulation,and experiment

Bryant,G.W., Liu,A.

SPIE - The International Society for Optical Engineering
7 国際会議録 Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy (Invited Paper)

Wang, G., Wu, Q., Xu, Z.

SPIE - The International Society of Optical Engineering
2 国際会議録 Numerical simulation of a new photon scanning tunneling microscope probe scanning imaging

Bai, F., Jian, G., Wu, S., Pan, S.

SPIE - The International Society of Optical Engineering
8 国際会議録 Scanning near-field optical microscopy(SNOM)with uncoated tips:applications in fluorescence techniques and Raman spectroscopy

Kaupp,G., Herrmann,A., Wagenblast,G.

SPIE - The International Society for Optical Engineering
3 国際会議録 Ultra-sensitive near-field Raman detection technique [6150-159]

Wu, S., Liu, K., Pan,S.

SPIE - The International Society of Optical Engineering
9 国際会議録 Novel nonoptical method of tip-sample distance regulation based on shear force in scanning near-field optical microscopy

Liu,X., Wang,J., Li,D.

SPIE - The International Society for Optical Engineering
4 国際会議録 Characterization of the self-assembled InP structure grown on the GaInP epitaxial layer mismatched to GaAs substrate by near-field scanning optical microscopy …

Wang, H., Liao, C., Fan, G., Liu, S.-H., Wu, Y., Wang, B., Zeng, G., Cai, J.

SPIE - The International Society of Optical Engineering
10 国際会議録 Ultrafast laser nanofabrication assisted with near-field scanning optical microscopy

Wang, W., Hong, M.H., Wu, D., Goh, Y.W., Lin, Y., Luo, P., Luk'yanchuk, B.S., Lu, Y., Chong, T.C.

SPIE - The International Society of Optical Engineering
5 国際会議録 Near-field scanning optical microscopy: electromagnetic coupling between the aperture tip and the sample

Gu,B.-Y., Li,Z.-Y., Yang,G.-Z.

SPIE-The International Society for Optical Engineering
11 国際会議録 Surface-enhanced Raman spectroscopy of urine by an ingenious near-infrared Raman spectrometer

S. Feng, W. Chen, Y. Li, G. Chen, Z. Huang

Society of Photo-optical Instrumentation Engineers
6 国際会議録 Scanning Near-Field Infrared Microscopy

Gillman, Edward S.

Electrochemical Society
12 国際会議録 Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

Taylor,R.S., Leopold,K.E., Wendman,M.A., Gurley,G., Elings,V.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12