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High-sensitivity photon-counting imaging detector

著者名:
Fu, L. ( Changchun Univ. of Science and Technology (China) )
Li, Y. ( Changchun Univ. of Science and Technology (China) )
Duanmu, Q. ( Changchun Univ. of Science and Technology (China) )
Wang, G. ( Changchun Univ. of Science and Technology (China) )
Wu, K. ( Changchun Univ. of Science and Technology (China) )
Jiang, D. ( Changchun Univ. of Science and Technology (China) )
Tian, J. ( Changchun Univ. of Science and Technology (China) )
さらに 2 件
掲載資料名:
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5633
発行年:
2004
開始ページ:
439
終了ページ:
442
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455888 [0819455881]
言語:
英語
請求記号:
P63600/5633
資料種別:
国際会議録

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