Polarization properties of a reflective LC on silicon SLM

Polarization properties of a reflective LC on silicon SLM

著者名:

Hallstig, E. J. ( Swedish Defense Research Agency (Sweden) )
Martin, T. ( Swedish Defense Research Agency (Sweden) )
Sjoqvist, L. J. ( Swedish Defense Research Agency (Sweden) )
Lindgren, M. ( Norwegian Univ. of Science and Tedhnology (Norway) )

掲載資料名:

Integrated optical devices, nanostructures, and displays : 26-28 October 2004, London, United Kingdom

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5618

発行年:

2004

開始ページ:

183

終了ページ:

194

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455710 [0819455717]

言語:

英語

請求記号:

P63600/5618

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014824
シリーズID:	PA00000029
会議名:	SPIE Security and Defence : tegrated Optical Devices, Nanostructures, and Displays
回次:	2004
会議開催地:	London, UK
会議開催年:	2004.10.26-2004.10.28

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