Characterization of sculptured thin films

Characterization of sculptured thin films

著者名:

Ryan, J. V. ( The Pennsylvania State Univ. (USA) )
Horn, M. W. ( The Pennsylvania State Univ. (USA) )
Lakhtakia, A. ( The Pennsylvania State Univ. (USA) )
Pantano, C. G. ( The Pennsylvania State Univ. (USA) )

掲載資料名:

Nanosensing: Materials and Devices

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5593

発行年:

2004

開始ページ:

643

終了ページ:

649

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455468 [0819455466]

言語:

英語

請求記号:

P63600/5593

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014799
シリーズID:	PA00000029
会議名:	Optics East : Nanosensing
回次:	2004
会議開催地:	Philadelphia, PA, USA
会議開催年:	2004.10.25-2004.10.28

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