Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors (Invited Paper)

Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors (Invited Paper)

著者名:

Weikle II, R. M. ( Univ. of Virginia (USA) )

Liu, Z. ( Univ. of Virginia (USA) )

Liu, H. ( Univ. of Virginia (USA) )

Liu, L. ( Univ. of Virginia (USA) )

Ulker, S. ( Girne American Univ. (Cyprus) )

Lichtenberger, A. W. ( Univ. of Virginia (USA) )

さらに 1 件

掲載資料名:

Nanofabrication: Technologies, Devices, and Applications

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5592

発行年:

2005

開始ページ:

328

終了ページ:

340

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455451 [0819455458]

言語:

英語

請求記号:

P63600/5592

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014798
シリーズID:	PA00000029
会議名:	Optics East : Nanofabrication
回次:	2004
会議開催地:	Philadelphia, PA, USA
会議開催年:	2004.10.25-2004.10.28

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