Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors (Invited Paper)
- 著者名:
Weikle II, R. M. ( Univ. of Virginia (USA) ) Liu, Z. ( Univ. of Virginia (USA) ) Liu, H. ( Univ. of Virginia (USA) ) Liu, L. ( Univ. of Virginia (USA) ) Ulker, S. ( Girne American Univ. (Cyprus) ) Lichtenberger, A. W. ( Univ. of Virginia (USA) ) - 掲載資料名:
- Nanofabrication: Technologies, Devices, and Applications
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5592
- 発行年:
- 2005
- 開始ページ:
- 328
- 終了ページ:
- 340
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455451 [0819455458]
- 言語:
- 英語
- 請求記号:
- P63600/5592
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
7
国際会議録
SHARC II: a Caltech Submillimeter Observatory facility camera with 384 pixels (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |