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Compact high-resolution imaging spectrometer (CHRIS) design and performance (Invited Paper)

著者名:
Cutter, M.A. ( Sira Technology Ltd. (United Kingdom) )  
掲載資料名:
Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5546
発行年:
2004
開始ページ:
126
終了ページ:
131
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454843 [0819454842]
言語:
英語
請求記号:
P63600/5546
資料種別:
国際会議録

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