4π Compton imaging with single 3D position-sensitive CdZnTe detector
- 著者名:
- Xu, D. ( Univ. of Michigan/Ann Arbor (USA) )
- He, Z. ( Univ. of Michigan/Ann Arbor (USA) )
- Lehner, C.E. ( Univ. of Michigan/Ann Arbor (USA) )
- Zhang, F. ( Univ. of Michigan/Ann Arbor (USA) )
- 掲載資料名:
- Hard X-Ray and Gamma-Ray Detector Physics VI
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5540
- 発行年:
- 2004
- 開始ページ:
- 144
- 終了ページ:
- 155
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819454782 [0819454788]
- 言語:
- 英語
- 請求記号:
- P63600/5540
- 資料種別:
- 国際会議録
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6
国際会議録
Direct Measurement of Electron Drift Parameters Using Depth-Sensing Single-Carrier CdZnTe Detectors
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