Blank Cover Image

Imaging with single-dimension kinoform lenses

著者名:
Stein, A. ( Brookhaven National Lab. (USA) )
Ablett, J.M. ( Brookhaven National Lab. (USA) )
Evans-Lutterodt, K. ( Brookhaven National Lab. (USA) )
Taylor, A. ( Lucent Technologies (USA) )
Klemens, F. ( Lucent Technologies (USA) )
Kornblit, A. ( Lucent Technologies (USA) )
Polvino, S. ( Columbia Univ. (USA) )
さらに 2 件
掲載資料名:
Design and microfabrication of novel x-ray optics II : 5-6 August 2004, Denver, Colorado, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5539
発行年:
2004
開始ページ:
80
終了ページ:
87
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454775 [081945477X]
言語:
英語
請求記号:
P63600/5539
資料種別:
国際会議録

類似資料:

1 国際会議録 Energy-dependent focusing properties of a kinoform Fresnel lens

Evans-Lutterodt, K., Ablett, J.M., Stein, A., Tennant, D.M., Klemens, F., Taylor, A.

SPIE - The International Society of Optical Engineering
7 国際会議録 X-ray lens with kinoform refractive profile created by x-ray lithography

Shabel'nikov, L., Nazmov, V., Pantenburg, F.J., Mohr, J., Saile, V., Yunkin, V., Kouznetsov, S., Pindyurin, V.F., …

SPIE-The International Society for Optical Engineering
2 国際会議録 Kinoform lenses: toward nanometer resolution (Invited Paper) [6002-36]

Stein A., Evans-Lutterodt K., Taylor A.

SPIE - The International Society of Optical Engineering
8 国際会議録 Modeling the performance of accommodating intraocular lenses

Ho, A., Manns, F., Pham, T., Evans, S., Parel, J.-M.

SPIE - The International Society of Optical Engineering
3 国際会議録 Hard x-ray Fresnel prisms: properties and applications

Ablett, J.M., Evans-Lutterodt, K., Stein, A.

SPIE - The International Society of Optical Engineering
9 国際会議録 Alignment mark detection in CMOS materials with SCALPEL e-beam lithography

Farrow,R.C., Waskiewicz,W.K., Kizilyalli,I.C., Callatin,G.M., Liddle,J.A., Mkrtchyan,M.M., Kornblit,A., Ocola,L.E., …

SPIE - The International Society for Optical Engineering
4 国際会議録 The Vertical Replacement-Gate (VRG) MOSFET: A High-Performance, Vertical MOSFET with Lithography-Independent Critical Dimensions

Hergenrother, J.M., Oh, S.H., Nigam, T., Monroe, D., Klemens, F.P., Kornblit, A., Baumann, F.H., Grazul, J.L., Johnson, …

Electrochemical Society
10 国際会議録 Three-Dimensional Imaging Sensors program

Browder,M.K., Evans,B., Beck,J.D., Blessinger,M.A., Blattner,W.S., LeBlanc,R., Miles,B.H.

SPIE-The International Society for Optical Engineering
5 国際会議録 Processing Challenges in the Fabrication of Advanced MEMs

Kornblit, A., Aksyuk, V. A., R Bogart, G., Bolle, C., Bower, J.E., Cirelli, R. A., Ferry, E., Fetter, L., Gasparyan, A., …

Electrochemical Society
11 国際会議録 Submicron Resolution X-RAY Strain Measurements on patterned Films: Some Hows and Whys

Marcus, M. A., Macdowell, A. A., Isaacs, E. D., Evans-Lutterodt, K., Ice, G. E.

MRS - Materials Research Society
6 国際会議録 High Density Plasma Gate Etching of 0.12 um Devices with Sub-1.5 nm Gate Oxides

Klemens, F.P., Baumann, F.H., Kornblit, A., Layadi, N., Lee, H., Maynard, H.L., Mytych, J.M., Sorch, T.W., Tennant, …

Electrochemical Society
12 国際会議録 Real-time vision-based detection of wire gapping on a rotating transformer core

C.J. Taylor, E. Evans, J.M. Dolan, P.K. Khosla

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12